专利名称：Test probe发明人：Wei-Fan Ting申请号：US125869申请日：20090824公开号：US07936178B2公开日：20110503
专利附图：
摘要：A test probe is provided. The test probe includes a group of shielding boardsand two probe pins. The group of shielding boards has two opposite surfaces. The groupof shielding boards includes at least two insulation boards and at least one metal board.The metal board is formed between the two insulation boards. The two probe pins are
formed on the two surfaces of the group of shielding boards and have a distancebetween each other.
申请人：Wei-Fan Ting
地址：Taipei TW
国籍：TW
代理机构：CKC & Partners Co., Ltd.
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