Automatic test equipment for integrated circuits

专利名称：Automatic test equipment for integrated

circuits

发明人：Paul K. K. Yeung,Alan D. Howard,James W.

Hoo,James L. Pennock

申请号：US06/910483申请日：19860923公开号：US04763066A公开日：19880809

摘要：The apparatus (10) includes a semiconductor tester (12) which in operationproduces an analog signature signal relative to a circuit node of an electronic circuit, suchas a pin connection of an integrated circuit. The analog signature signal is the result ofhorizontal and vertical signals which are also directed to an integrator/A-D converter (44)which produces therefrom a set of four digital signals representing said analog signature.These digital signals are then compared in a computer (50) against reference digitalvalues for the same circuit node of the same electronic circuit which is known to be good.If the digital signals are not within a selected range relative to the reference digitalvalues, the analog signature of the circuit node is displayed for inspection and evaluationby an operator.

申请人：HUNTRON INSTRUMENTS, INC.

代理机构：Graybeal, Jensen & Puntigam

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